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download between 0-24 hoursReleased: 2005
ISO 18452:2005
ISO 18452:2005-Fine ceramics (advanced ceramics, advanced technical ceramics)-Determination of thickness of ceramic films by contact-probe profilometer
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| Standard´s number: | ISO 18452:2005 |
| Pages: | 9 |
| Edition: | 1 |
| Released: | 2005 |
DESCRIPTION
ISO 18452:2005
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.