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immediate downloadReleased: 2005-11-16
ISO 18452:2005
ISO 18452:2005 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
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English PDF
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89.39 USD
English Hardcopy
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89.39 USD
French PDF
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89.39 USD
French Hardcopy
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89.39 USD
| Standard´s number: | ISO 18452:2005 |
| Edition: | 1 |
| Released: | 2005-11-16 |
| Pages (English): | 9 |
| Pages (French): | 9 |
DESCRIPTION
ISO 18452:2005
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.