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in stockReleased: 2011-12-21
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
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English PDF
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30.80 EUR
English Hardcopy
In stock
30.80 EUR
Spanish PDF
Immediate download
Printable
30.80 EUR
Spanish Hardcopy
In stock
30.80 EUR
| Standard number: | UNE EN 60749-23:2005/A1:2011 |
| Pages: | 14 |
| Released: | 2011-12-21 |
| Status: | Amendment |
| Pages (Spanish): | 8 |
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