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in stockReleased: 2005-03-16
UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
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English PDF
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66.00 USD
English Hardcopy
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66.00 USD
Spanish PDF
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66.00 USD
Spanish Hardcopy
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66.00 USD
| Standard number: | UNE EN 60749-23:2005 |
| Pages: | 25 |
| Released: | 2005-03-16 |
| Status: | Standard |
| Pages (Spanish): | 12 |
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