Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
in stockReleased: 2005-03-16
UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

UNE EN 60749-33:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

Dispositivos semiconductores. Ensayos mecánicos y climáticos. Parte 33: Resistencia a la humedad acelerada. Autoclave no polarizada

Format
Availability
Price and currency
English PDF
Immediate download
57.20 USD
English Hardcopy
In stock
57.20 USD
Spanish PDF
Immediate download
47.67 USD
Spanish Hardcopy
In stock
47.67 USD
Standard number:UNE EN 60749-33:2005
Pages:17
Released:2005-03-16
DESCRIPTION

This standard UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
Print