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>UNE standards>UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
in stockReleased: 2004-03-18
UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

UNE EN 60749-36:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 36: Aceleración constante.

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English PDF
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46.20 EUR
English Hardcopy
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Spanish PDF
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38.50 EUR
Spanish Hardcopy
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38.50 EUR
Standard number:UNE EN 60749-36:2004
Pages:15
Released:2004-03-18
Status:Standard
Pages (Spanish):8
DESCRIPTION

This standard UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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