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UNE EN 60749-38:2008
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 38: Método de ensayo del error transitorio para dispositivos semiconductores con memoria. (Ratificada por AENOR en septiembre de 2008.)
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| Standard number: | UNE EN 60749-38:2008 |
| Pages: | 16 |
| Released: | 2008-09-01 |
DESCRIPTION
This standard UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.) is classified in these ICS categories:
- 31.080.01