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UNE EN 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 4: Ensayo continuo fuertemente acelerado de esfuerzo de calor húmedo (HAST). (Ratificada por la Asociación Española de Normalización en julio de 2017.)
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| Standard number: | UNE EN 60749-4:2017 |
| Pages: | 19 |
| Released: | 2017-07-01 |
| Status: | Standard |
DESCRIPTION
UNE EN 60749-4:2017
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.