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UNE EN 60749-44:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 44: Método de ensayo por efecto de evento único (SEE) mediante haz de neutrones irradiados para dispositivos semiconductores. (Ratificada por AENOR en diciembre de 2016.)
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| Standard number: | UNE EN 60749-44:2016 |
| Pages: | 28 |
| Released: | 2016-12-01 |
DESCRIPTION
This standard UNE EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.) is classified in these ICS categories:
- 31.080.01