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>UNE standards>UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
in stockReleased: 2011-12-01
UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)

UNE EN 60749-7:2011

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 7: Medición del contenido de humedad interna y análisis de otros gases residuales. (Ratificada por AENOR en diciembre de 2011.)

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Standard number:UNE EN 60749-7:2011
Pages:14
Released:2011-12-01
Status:Standard
DESCRIPTION

This standard UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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