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Homepage>UNE standards>UNE EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
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in stockReleased: 2012-11-01
UNE EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)

UNE EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)

Circuitos integrados. Medición de la inmunidad electromagnética. Parte 8: Medición de la inmunidad radiada. Método de la línea TEM de placas con circuito integrado (IC) (Ratificada por AENOR en noviembre de 2012.)

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Standard number:UNE EN 62132-8:2012
Pages:26
Released:2012-11-01
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This standard UNE EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.) is classified in these ICS categories:

  • 31.200