PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
Sponsored link
in stockReleased: 2006-11-01
UNE EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)  (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)

UNE EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)

Ensayo de estabilidad a temperatura Bias para óxido metálico, semiconductores, transistores de efecto de campo (IEC 62373:2006) (Ratificada por AENOR en noviembre de 2006).

Format
Availability
Price and currency
English PDF
Immediate download
76.42 USD
English Hardcopy
In stock
76.42 USD
Standard number:UNE EN 62373:2006
Pages:17
Released:2006-11-01
DESCRIPTION
This standard UNE EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.) is classified in these ICS categories:
  • 31.080.30