Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS IEC 63068-4:2022 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
immediate downloadReleased: 2022-09-07
BS IEC 63068-4:2022 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

BS IEC 63068-4:2022

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

Format
Availability
Price and currency
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
Standard number:BS IEC 63068-4:2022
Pages:28
Released:2022-09-07
ISBN:978 0 539 18417 4
Status:Standard
DESCRIPTION

BS IEC 63068-4:2022


This standard BS IEC 63068-4:2022 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Print