New VDA 4: 2020, English version 2021 is avilable here.

 

31.080.99 Other semiconductor devices

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immediate download
Released: 2018-12-06
18/30380675 DC
BS EN IEC 62830-7. Semiconductor devices. Semiconductor devices for energy harvesting and generation Part 7. Linear sliding mode triboelectric energy harvesting
LANGUAGE
English
immediate download
Released: 2018-12-04
18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
LANGUAGE
English
immediate download
Released: 2018-12-11
18/30386543 DC
BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
LANGUAGE
English
immediate download
Released: 2019-02-21
19/30392174 DC
BS EN 60747-5-6. Semiconductor devices Part 5-6. Optoelectronic devices. Light emitting diodes
LANGUAGE
English
immediate download
Released: 2019-09-13
19/30394477 DC
BS EN IEC 63244-1. Semiconductor devices. Semiconductor devices for wireless power transfer and charging Part 1. General requirements and specifications
LANGUAGE
English
immediate download
Released: 2019-11-08
19/30395503 DC
BS EN IEC 62830-8. Semiconductor devices. Semiconductor devices for energy harvesting and generation Part 8. Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
LANGUAGE
English
immediate download
Released: 2019-10-17
19/30404655 DC
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
LANGUAGE
English
immediate download
Released: 2020-06-05
20/30405217 DC
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices Part 40. Test methods of Micro-electromechanical inertial shock switch threshold
LANGUAGE
English
immediate download
Released: 2020-04-01
20/30406234 DC
BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test method for bipolar degradation by body diode operating
LANGUAGE
English
immediate download
Released: 2020-04-01
20/30409285 DC
BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
LANGUAGE
English
immediate download
Released: 2020-03-05
20/30414411 DC
BS EN 60747-16-7. Semiconductor devices Part 16-7. Microwave integrated circuits. Attenuators
LANGUAGE
English
immediate download
Released: 2020-03-05
20/30414415 DC
BS EN 60747-16-8. Semiconductor devices Part 16-8. Microwave integrated circuits. Limiters
LANGUAGE
English