31.080.99 Other semiconductor devices

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Released: 2018-12-04
18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
LANGUAGE
English
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Released: 2019-01-04
19/30364443 DC
BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices
LANGUAGE
English
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Released: 2019-02-21
19/30392174 DC
BS EN 60747-5-6. Semiconductor devices Part 5-6. Optoelectronic devices. Light emitting diodes
LANGUAGE
English
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Released: 2020-02-07
20/30404083 DC
BS IEC 62047-38. Semiconductor devices. Micro-electromechanical devices Part 38. Test method for adhesion strength of metal powder paste in MEMS interconnection
LANGUAGE
English
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Released: 2020-03-06
20/30404574 DC
BS EN IEC 62047-41. Semiconductor devices. Micro-electromechanical devices Part 41. RF MEMS Circulators and Isolators
LANGUAGE
English
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Released: 2020-06-05
20/30405217 DC
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices Part 40. Test methods of Micro-electromechanical inertial shock switch threshold
LANGUAGE
English
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Released: 2020-04-01
20/30406234 DC
BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test method for bipolar degradation by body diode operating
LANGUAGE
English
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Released: 2020-04-01
20/30409285 DC
BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
LANGUAGE
English
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Released: 1987-10-30
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
LANGUAGE
English
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Released: 1983-05-31
BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
LANGUAGE
English
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Released: 2000-08-15
BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
LANGUAGE
English
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Released: 2007-02-28
BS EN 60464-2:2001
Varnishes used for electrical insulation Methods of test
LANGUAGE
English