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English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Released: 2019-03-05
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Released: 2019-05-15
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270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Released: 2019-05-10
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
317.20 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
31.72 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
95.16 USD
English Hardcopy
In stock
317.20 USD
BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD