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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Released: 2013-10-31
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210.67 USD
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21.07 USD
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Reading the standardfor 24 hours
63.20 USD
English Hardcopy
In stock
210.67 USD
English Secure PDF
Immediate download
293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Released: 2018-08-30
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS IEC 62951-3:2018
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
Released: 2018-11-15
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN 62047-1:2016
Semiconductor devices. Micro-electromechanical devices Terms and definitions
Semiconductor devices. Micro-electromechanical devices Terms and definitions
Released: 2016-04-30
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344.00 USD
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34.40 USD
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103.20 USD
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344.00 USD
BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Released: 2016-05-31
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344.00 USD
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34.40 USD
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103.20 USD
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344.00 USD
PD IEC/TR 62258-7:2007
Semiconductor die products XML schema for data exchange
Semiconductor die products XML schema for data exchange
Released: 2007-11-30
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Released: 2013-10-31
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344.00 USD
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34.40 USD
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103.20 USD
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344.00 USD
BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Released: 2015-07-31
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210.67 USD
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21.07 USD
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Reading the standardfor 24 hours
63.20 USD
English Hardcopy
In stock
210.67 USD
English Secure PDF
Immediate download
210.67 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
21.07 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
63.20 USD
English Hardcopy
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210.67 USD
BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Released: 2018-03-16
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386.67 USD
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38.67 USD
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Reading the standardfor 24 hours
116.00 USD
English Hardcopy
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386.67 USD