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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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27.06 USD
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27.06 USD
BS EN IEC 62969-1:2018
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Released: 2018-02-22
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213.76 USD
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213.76 USD
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213.76 USD
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213.76 USD
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213.76 USD
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297.65 USD
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297.65 USD
22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Released: 2022-05-05
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48.71 USD
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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
Semiconductor devices Microwave integrated circuits. Oscillators
Released: 2020-09-24
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392.35 USD
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BS EN IEC 60904-4:2020
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Released: 2020-10-19
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349.06 USD
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27.06 USD
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PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Released: 2021-11-19
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446.47 USD
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BS IEC 62047-41:2021
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Released: 2021-06-28
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349.06 USD
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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