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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 2006-09-29
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208.91 USD
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20.89 USD
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Reading the standardfor 24 hours
62.67 USD
English Hardcopy
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208.91 USD
English Secure PDF
Immediate download
208.91 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.89 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
62.67 USD
English Hardcopy
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208.91 USD
English Secure PDF
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290.89 USD
You can read the standard for 1 hour. More information in the category: E-reading
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29.09 USD
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87.27 USD
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290.89 USD
BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Semiconductor devices. Hot carrier test on MOS transistors
Released: 2010-07-31
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177.18 USD
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17.72 USD
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53.15 USD
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177.18 USD
17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2017-11-30
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26.44 USD
English Hardcopy
In stock
26.44 USD
English Secure PDF
Immediate download
208.91 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.89 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
62.67 USD
English Hardcopy
In stock
208.91 USD
English Secure PDF
Immediate download
208.91 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.89 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
62.67 USD
English Hardcopy
In stock
208.91 USD
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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208.91 USD
You can read the standard for 1 hour. More information in the category: E-reading
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20.89 USD
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Reading the standardfor 24 hours
62.67 USD
English Hardcopy
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208.91 USD
English Secure PDF
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208.91 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.89 USD
You can read the standard for 24 hours. More information in the category: E-reading
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62.67 USD
English Hardcopy
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208.91 USD
BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Released: 2023-03-30
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290.89 USD
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29.09 USD
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87.27 USD
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290.89 USD
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Released: 2021-09-08
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208.91 USD
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20.89 USD
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62.67 USD
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208.91 USD
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2018-08-03
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26.44 USD
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26.44 USD