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19 results
First pagePrev12BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
Released: 2023-03-30
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Released: 2020-09-25
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Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Released: 2021-09-08
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Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
19 results
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