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71.040.40 Chemical analysis
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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Released: 2011-08-31
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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BS EN ISO 6145-8:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Released: 2009-02-28
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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309.60 EUR
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264.00 EUR
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BS EN IEC 60746-4:2019
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Released: 2019-03-12
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434.40 EUR
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369.60 EUR
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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Released: 2022-08-03
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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189.60 EUR
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189.60 EUR
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264.00 EUR
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