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71.040.40 Chemical analysis
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BS EN ISO 6142-1:2015
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2015-09-30
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BS 6337-2:1983
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
Released: 1983-01-31
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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Released: 2005-03-31
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Released: 2022-08-03
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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