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31.140 Piezoelectric and dielectric devices
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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BS EN 168101:1997
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Released: 1990-12-31
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155.44 EUR
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24/30493194 DC
BS EN IEC 60679-2 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 2: Guide to the use of quartz crystal oscillators
BS EN IEC 60679-2 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 2: Guide to the use of quartz crystal oscillators
Released: 2024-05-10
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