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31.140 Piezoelectric and dielectric devices
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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414.00 USD
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN IEC 60122-4:2019
Quartz crystal units of assessed quality Crystal units with thermistors
Quartz crystal units of assessed quality Crystal units with thermistors
Released: 2019-03-28
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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Released: 2017-12-08
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BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Released: 2022-10-31
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368.00 USD
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BS EN IEC 63041-3:2020
Piezoelectric sensors Physical sensors
Piezoelectric sensors Physical sensors
Released: 2020-10-01
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BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Released: 2021-11-05
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BS EN IEC 61837-2:2018+A1:2020
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Released: 2020-11-13
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BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Released: 2026-04-16
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