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31.140 Piezoelectric and dielectric devices
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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BS EN 61019-2:2005
Surface acoustic wave (SAW) resonators Guide to the use
Surface acoustic wave (SAW) resonators Guide to the use
Released: 2005-10-18
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311.15 USD
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Released: 2002-10-10
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Released: 2026-04-16
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410.40 USD
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410.40 USD
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BS EN 60444-9:2007
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Released: 2007-05-31
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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BS EN IEC 61837-2:2018+A1:2020
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Released: 2020-11-13
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466.73 USD
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