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31.140 Piezoelectric and dielectric devices
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BS EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Released: 2019-07-15
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313.88 USD
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BS EN IEC 63041-1:2021
Piezoelectric sensors Generic specifications
Piezoelectric sensors Generic specifications
Released: 2021-11-23
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368.00 USD
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PD IEC TS 61994-5:2019
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric sensors
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric sensors
Released: 2019-07-17
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192.12 USD
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BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2022-11-11
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BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2023-01-23
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516.82 USD
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BS EN IEC 60122-2:2025
Quartz crystal units of assessed quality Guidelines for the use
Quartz crystal units of assessed quality Guidelines for the use
Released: 2025-09-04
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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-04-30
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414.00 USD
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BS EN 60444-7:2004
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Released: 2004-09-03
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192.12 USD
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BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
Synthetic quartz crystal. Specifications and guidelines for use
Released: 2016-09-30
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435.65 USD
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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224.59 USD
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224.59 USD
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192.12 USD
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BS EN 61338-4:2005
Waveguide type dielectric resonators Sectional specification
Waveguide type dielectric resonators Sectional specification
Released: 2005-12-16
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224.59 USD
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