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31.140 Piezoelectric and dielectric devices
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BS EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Released: 2012-09-30
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Released: 1993-09-15
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224.59 USD
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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Released: 2019-04-18
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1995-04-15
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192.12 USD
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BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
Synthetic quartz crystal. Specifications and guidelines for use
Released: 2016-09-30
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BS EN 60758:2016 - TC
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Released: 2020-02-26
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611.53 USD
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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24/30505496 DC
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
Released: 2024-11-22
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27.06 USD
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-05-15
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