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31.140 Piezoelectric and dielectric devices
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BS EN 62884-1:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
Released: 2017-10-04
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367.20 EUR
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BS EN IEC 63041-1:2021
Piezoelectric sensors Generic specifications
Piezoelectric sensors Generic specifications
Released: 2021-11-23
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309.60 EUR
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BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2022-11-11
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BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2023-01-23
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434.40 EUR
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BS EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Released: 2019-07-15
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24/30492753 DC
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
Released: 2024-05-09
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24.00 EUR
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24.00 EUR
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24.00 EUR
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24.00 EUR
BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-04-30
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348.00 EUR
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348.00 EUR
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160.80 EUR
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160.80 EUR
BS EN 60444-7:2004
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Released: 2004-09-03
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160.80 EUR
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160.80 EUR
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367.20 EUR
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1995-04-15
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264.00 EUR
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