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BS EN 170101:2001
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval
Released: 2001-11-26
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155.44 EUR
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PD IEC TS 61994-5:2019
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric sensors
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric sensors
Released: 2019-07-17
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BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2023-01-23
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419.92 EUR
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BS EN IEC 63041-1:2021
Piezoelectric sensors Generic specifications
Piezoelectric sensors Generic specifications
Released: 2021-11-23
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BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2022-11-11
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24/30492753 DC
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
Released: 2024-05-09
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23.20 EUR
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23.20 EUR
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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-04-30
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Released: 1993-09-15
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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Released: 2019-04-18
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255.20 EUR
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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BS EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Released: 2012-09-30
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