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31.140 Piezoelectric and dielectric devices
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BS EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Released: 2019-07-15
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BS EN 62884-1:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
Released: 2017-10-04
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342.72 EUR
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BS EN 61338-2:2004
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Released: 2004-10-20
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288.96 EUR
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BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2022-11-11
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BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Released: 2023-01-23
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405.44 EUR
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BS EN IEC 60122-2:2025
Quartz crystal units of assessed quality Guidelines for the use
Quartz crystal units of assessed quality Guidelines for the use
Released: 2025-09-04
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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-04-30
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324.80 EUR
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24/30492753 DC
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
BS EN IEC 63541. Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications. Specifications and measuring method
Released: 2024-05-09
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BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
Synthetic quartz crystal. Specifications and guidelines for use
Released: 2016-09-30
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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Released: 2019-04-18
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Released: 2019-04-16
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