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31.140 Piezoelectric and dielectric devices
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150.08 EUR
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BS EN 61338-4:2005
Waveguide type dielectric resonators Sectional specification
Waveguide type dielectric resonators Sectional specification
Released: 2005-12-16
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Released: 1993-09-15
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BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Released: 2015-12-31
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342.72 EUR
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BS EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Released: 2012-09-30
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1995-04-15
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BS EN 60444-7:2004
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Released: 2004-09-03
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BS EN 60758:2016 - TC
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Released: 2020-02-26
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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