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Homepage>BSI Standards >31 ELECTRONICS>31.140 Piezoelectric and dielectric devices

31.140 Piezoelectric and dielectric devices

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111 results
First page135678910Last page
BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Released: 1995-04-15
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BS EN 61338-4:2005
Waveguide type dielectric resonators Sectional specification
Released: 2005-12-16
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DD IEC/TS 61994-2:2011
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters
Released: 2011-07-31
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BS EN 169101:1995
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval)
Released: 1995-05-15
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DD IEC/TS 61994-4-2:2011
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric materials. Piezoelectric ceramics
Released: 2011-04-30
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BS EN 60444-7:2004
Measurement of quartz crystal unit parameters Measurement of activity and frequency dips of quartz crystal units
Released: 2004-09-03
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BS EN 60444-5:1997
Measurement of quartz crystal unit parameters Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
Released: 1995-10-15
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BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Released: 2015-12-31
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BS EN 60758:2016 - TC
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
Released: 2020-02-26
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BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
Released: 2016-09-30
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24/30490992 DC
BS EN IEC 60444-11. Measurement of quartz crystal unit parameters Part 11. Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Released: 2024-04-05
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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111 results
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