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31.140 Piezoelectric and dielectric devices
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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23/30472821 DC
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
Released: 2023-04-12
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23.20 EUR
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-05-15
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470.96 EUR
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470.96 EUR
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23.20 EUR
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BS EN 60368-4:2001
Piezoelectric filters Sectional specification. Capability approval
Piezoelectric filters Sectional specification. Capability approval
Released: 2001-06-15
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255.20 EUR
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255.20 EUR
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382.80 EUR
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BS EN 61029-1:2009+A11:2010
Safety of transportable motor-operated electric tools General requirements
Safety of transportable motor-operated electric tools General requirements
Released: 2011-06-30
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382.80 EUR
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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255.20 EUR
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BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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155.44 EUR
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BS EN IEC 60122-4:2019
Quartz crystal units of assessed quality Crystal units with thermistors
Quartz crystal units of assessed quality Crystal units with thermistors
Released: 2019-03-28
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BS EN 60444-9:2007
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Released: 2007-05-31
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183.28 EUR
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183.28 EUR