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31.140 Piezoelectric and dielectric devices
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-05-15
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24/30503297 DC
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
Released: 2024-11-01
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24/30505496 DC
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
Released: 2024-11-22
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BS EN 61019-2:2005
Surface acoustic wave (SAW) resonators Guide to the use
Surface acoustic wave (SAW) resonators Guide to the use
Released: 2005-10-18
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Released: 2002-10-10
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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