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31.140 Piezoelectric and dielectric devices
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24/30503297 DC
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
Released: 2024-11-01
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24/30505496 DC
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
Released: 2024-11-22
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Released: 2025-05-15
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454.72 EUR
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Released: 2015-11-30
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342.72 EUR
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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