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31.140 Piezoelectric and dielectric devices
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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183.28 EUR
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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336.40 EUR
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336.40 EUR
DD IEC/TS 61994-4-3:2008
Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials. Materials for dielectric devices
Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials. Materials for dielectric devices
Released: 2008-05-30
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155.44 EUR
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155.44 EUR
BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Released: 2015-11-30
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354.96 EUR
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BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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255.20 EUR
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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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299.28 EUR
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BS EN 61019-2:2005
Surface acoustic wave (SAW) resonators Guide to the use
Surface acoustic wave (SAW) resonators Guide to the use
Released: 2005-10-18
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255.20 EUR
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Released: 2002-10-10
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255.20 EUR
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Released: 2017-12-08
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255.20 EUR
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