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31.140 Piezoelectric and dielectric devices
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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189.60 EUR
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189.60 EUR
BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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264.00 EUR
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264.00 EUR
DD IEC/TS 61994-4-3:2008
Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials. Materials for dielectric devices
Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials. Materials for dielectric devices
Released: 2008-05-30
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160.80 EUR
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160.80 EUR
BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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309.60 EUR
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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264.00 EUR
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BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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264.00 EUR
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BS EN 60793-1-33:2017 - TC
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Released: 2020-02-25
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487.20 EUR
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BS EN 60444-9:2007
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Released: 2007-05-31
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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348.00 EUR
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348.00 EUR
BS EN IEC 63041-3:2020
Piezoelectric sensors Physical sensors
Piezoelectric sensors Physical sensors
Released: 2020-10-01
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BS EN IEC 61837-2:2018+A1:2020
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Ceramic enclosures
Released: 2020-11-13
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396.00 EUR
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