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BS ISO 20579-2:2025
Surface chemical analysis — Sample handling, preparation and mounting Documenting and reporting the preparation and mounting of specimens for analysis
Surface chemical analysis — Sample handling, preparation and mounting Documenting and reporting the preparation and mounting of specimens for analysis
Released: 2025-02-25
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25/30511828 DC
BS ISO 25095-2 Propylene oxide for industrial use Part 2: Determination of aldehydes — Liquid chromatography
BS ISO 25095-2 Propylene oxide for industrial use Part 2: Determination of aldehydes — Liquid chromatography
Released: 2025-07-23
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25/30532550 DC
BS ISO 19229:2019/Amd 1 Gas analysis — Purity analysis and the treatment of purity data - Amendment 1:: Correction of formula A.4
BS ISO 19229:2019/Amd 1 Gas analysis — Purity analysis and the treatment of purity data - Amendment 1:: Correction of formula A.4
Released: 2025-11-17
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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BS EN IEC 60746-4:2019
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Released: 2019-03-12
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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Released: 2005-03-31
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Released: 2011-08-31
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