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71.040.40 Chemical analysis
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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PD ISO/TR 14187:2020
Surface chemical analysis. Characterization of nanostructured materials
Surface chemical analysis. Characterization of nanostructured materials
Released: 2020-07-03
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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Released: 2022-08-03
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 13084:2025 - TC
Tracked Changes. Surface chemical analysis. Mass spectrometries. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Tracked Changes. Surface chemical analysis. Mass spectrometries. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Released: 2025-11-17
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BS ISO 11505:2025 - TC
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-07-16
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BS ISO 20579-1:2024
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Released: 2024-09-24
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