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BS EN ISO 6142-1:2015
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2015-09-30
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BS 6337-2:1983
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
Released: 1983-01-31
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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Released: 2005-03-31
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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288.96 EUR
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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Released: 2011-08-31
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BS EN IEC 60746-4:2019
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Released: 2019-03-12
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405.44 EUR
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PD ISO/TR 14187:2020
Surface chemical analysis. Characterization of nanostructured materials
Surface chemical analysis. Characterization of nanostructured materials
Released: 2020-07-03
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BS ISO 11505:2025
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-06-23
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BS ISO 11505:2025 - TC
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-07-16
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