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Homepage>IEEE Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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34 results
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IEEE 1481-2019 - IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
Released: 13.03.2020
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584.92 USD
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432.71 USD
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540.89 USD
IEEE 1804-2017 - IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
Released: 31.01.2018
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67.93 USD
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85.54 USD
IEEE 1801a-2014 - IEEE Standard for Design and Verification of Low-Power Integrated Circuits--Amendment 1
IEEE Standard for Design and Verification of Low-Power Integrated Circuits--Amendment 1
Released: 30.09.2014
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91.82 USD
IEEE/IEC 61523-4-2015 - IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
Released: 24.03.2015
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383.66 USD
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483.02 USD
IEEE 1838-2019 - IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
Released: 13.03.2020
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124.53 USD
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155.98 USD
IEEE 1241-2000 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
Released: 22.06.2001
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183.65 USD
IEEE 605-2023 - IEEE Guide for Bus Design in Air Insulated Substations
IEEE Guide for Bus Design in Air Insulated Substations
Released: 24.07.2024
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315.61 USD
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233.28 USD
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291.60 USD
IEEE 1581-2011 - IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
Released: 20.06.2011
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129.56 USD
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129.56 USD
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157.24 USD
IEEE 1481-2009 - IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
Released: 11.03.2010
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379.88 USD
IEEE 1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Released: 13.05.2013
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463.13 USD
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488.28 USD
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344.20 USD
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363.65 USD
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412.81 USD
IEEE 1181-1991 - IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
Released: 13.12.1991
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227.68 USD
IEEE 605-1987 - IEEE Guide for Design of Substation Rigid-Bus Structures
IEEE Guide for Design of Substation Rigid-Bus Structures
Released: 20.05.1987
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65.41 USD
34 results
13Last page