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UNE EN 60749-39:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 39: Medida de la difusividad de la humedad y solubilidad en agua en materiales orgánicos para componentes semiconductores (IEC 60749-39:2006). (Ratificada por AENOR en noviembre de 2006.)
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| Standard number: | UNE EN 60749-39:2006 |
| Pages: | 13 |
| Released: | 2006-11-01 |
DESCRIPTION
This standard UNE EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.) is classified in these ICS categories:
- 31.080.01