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BS EN IEC 62228-7 Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
BS EN IEC 62228-7 Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Released: 2024-09-06
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BS IEC 63055:2023
Format for LSI-Package-Board Interoperable design
Format for LSI-Package-Board Interoperable design
Released: 2023-11-08
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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
Standard testability method for embedded core-based integrated circuits
Released: 2007-12-31
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BS EN 62132-2:2011
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Released: 2011-04-30
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BS EN 62132-8:2012
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Released: 2012-10-31
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BS EN 62433-4:2016
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
Released: 2016-11-30
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Released: 2006-07-31
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Released: 2014-09-30
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Released: 2013-10-31
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BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
Released: 1990-12-31
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BS CECC 90000:1985
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Released: 1985-11-29
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