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224.59 USD
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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
Standard testability method for embedded core-based integrated circuits
Released: 2007-12-31
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470.82 USD
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Released: 2006-07-31
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313.88 USD
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Released: 2014-09-30
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BS EN 62132-2:2011
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Released: 2011-04-30
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BS EN 62132-8:2012
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Released: 2012-10-31
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470.82 USD
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Released: 2013-10-31
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368.00 USD
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BS EN 62433-4:2016
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
Released: 2016-11-30
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BS EN 61964:1999
Integrated circuits. Memory devices pin configurations
Integrated circuits. Memory devices pin configurations
Released: 1999-09-15
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BS EN IEC 61967-1:2019 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Released: 2020-02-24
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PD IEC TR 62433-4-1:2025
EMC IC modelling Use of ICIM-CI model to predict the IC conducted immunity in a PCB
EMC IC modelling Use of ICIM-CI model to predict the IC conducted immunity in a PCB
Released: 2025-08-29
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