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Main page>BSI Standards >31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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139 results
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BS EN 190103:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS
Released: 1983-01-15
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BS CECC 63201:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval)
Released: 1985-06-15
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BS IEC 60748-11:2000
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Released: 2011-07-31
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BS EN 62433-2:2017
EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
Released: 2017-11-14
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BS EN 190107:1994
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F
Released: 1987-09-15
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BS QC 760101:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
Released: 1997-08-15
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BS QC 790132:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
Released: 1992-01-31
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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
Released: 2007-12-31
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BS EN 62132-8:2012
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Released: 2012-10-31
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BS IEC 60748-23-2:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection and special tests
Released: 2002-06-21
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Released: 2013-10-31
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BS EN IEC 61967-1:2019 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Released: 2020-02-24
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139 results
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