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BS IEC 60748-2:1997
Semiconductor devices. Integrated circuits Digital integrated circuits
Semiconductor devices. Integrated circuits Digital integrated circuits
Released: 1998-04-15
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479.01 USD
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479.01 USD
PD IEC/TR 61352:2006
Mnemonics and symbols for integrated circuits
Mnemonics and symbols for integrated circuits
Released: 2006-07-17
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443.22 USD
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443.22 USD
BS EN 62433-3:2017
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
Released: 2017-12-13
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479.01 USD
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BS EN 190000:1996
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Released: 1996-03-15
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479.01 USD
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BS EN 60684-3-145 to 147:2001
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Released: 2001-12-21
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195.46 USD
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195.46 USD
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319.34 USD
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319.34 USD
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319.34 USD
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BS EN 61943:1999
Integrated circuits. Manufacturing line approval application guideline
Integrated circuits. Manufacturing line approval application guideline
Released: 1999-12-15
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319.34 USD
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319.34 USD
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319.34 USD
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BS EN 190101:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Released: 1990-07-15
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228.49 USD
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228.49 USD
PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Released: 2015-09-30
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443.22 USD
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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Released: 2001-06-15
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