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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Released: 2006-01-23
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BS CECC 90301:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers
Released: 1985-09-15
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BS CECC 90300:1988
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
Released: 1988-06-30
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BS 6493-2.3:1987
Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
Released: 1987-01-30
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BS CECC 90203:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits
Released: 1985-08-15
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BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices Microwave integrated circuits. Limiters
Released: 2023-05-25
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