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Main page>BSI Standards >31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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139 results
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BS QC 790104:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
Released: 1992-05-15
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BS IEC 63011-2:2018
Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
Released: 2019-01-24
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BS QC 790131:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
Released: 1992-05-01
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BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Released: 2007-11-30
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DD IEC/TS 62215-2:2007
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
Released: 2007-11-30
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BS CECC 90000:Addendum No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection
Released: 1983-07-29
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BS CECC 90103:1980
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
Released: 1980-04-15
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BS EN 190109:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU
Released: 1986-11-15
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BS EN 190102:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
Released: 1980-04-15
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BS EN IEC 61967-4:2021
Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
Released: 2021-05-06
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21/30433680 DC
BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Released: 2021-02-05
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25/30511073 DC
Draft BS EN 62228-3 Ed.2.0 Integrated circuits. EMC evaluation of transceivers Part 3. CAN transceivers
Released: 2025-02-19
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139 results
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