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BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Attenuators
Released: 2023-05-25
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BS EN IEC 62228-3:2019
Integrated circuits. EMC evaluation of transceivers CAN transceivers
Integrated circuits. EMC evaluation of transceivers CAN transceivers
Released: 2023-09-18
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382.80 EUR
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BS EN IEC 61967-8:2023
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Released: 2023-06-15
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183.28 EUR
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25/30531426 DC
Draft BS EN 63664 Integrated Circuits. Electronic fuses for low voltage automotive power distribution networks
Draft BS EN 63664 Integrated Circuits. Electronic fuses for low voltage automotive power distribution networks
Released: 2025-07-21
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23.20 EUR
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BS IEC 60748-5:1997
Semiconductor devices. Integrated circuits Semicustom integrated circuits
Semiconductor devices. Integrated circuits Semicustom integrated circuits
Released: 1997-08-15
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255.20 EUR
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BS EN 60684-3-145 to 147:2001
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Released: 2001-12-21
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155.44 EUR
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155.44 EUR
English Secure PDF
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255.20 EUR
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255.20 EUR
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255.20 EUR
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PD IEC/TR 61352:2006
Mnemonics and symbols for integrated circuits
Mnemonics and symbols for integrated circuits
Released: 2006-07-17
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354.96 EUR
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BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
Released: 1985-01-31
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PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Released: 2015-09-30
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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Released: 2001-06-15
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