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BS EN 190101:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Released: 1990-07-15
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BS EN 61943:1999
Integrated circuits. Manufacturing line approval application guideline
Integrated circuits. Manufacturing line approval application guideline
Released: 1999-12-15
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BS EN 62090:2017
Product package labels for electronic components using bar code and two- dimensional symbologies
Product package labels for electronic components using bar code and two- dimensional symbologies
Released: 2017-07-31
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BS EN 62433-3:2017
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
Released: 2017-12-13
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BS EN 190000:1996
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Released: 1996-03-15
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PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Released: 2015-09-30
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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Released: 2001-06-15
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BS EN 62132-1:2016
Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
Released: 2016-03-31
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BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
Released: 2002-06-18
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