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BS EN 60747-16-10:2004
Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Released: 2004-11-09
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BS EN 62132-5:2006
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
Released: 2006-03-31
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BS EN IEC 61967-8:2023 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Released: 2023-06-26
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24/30501110 DC
BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method
BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method
Released: 2024-09-27
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BS IEC 60748-4-3:2006
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Released: 2007-02-28
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288.96 EUR
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Released: 2014-09-30
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BS QC 760000:1990
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
Released: 1990-04-30
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BS CECC 63101:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Released: 1985-01-15
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BS IEC 60748-1:2002
Semiconductor devices. Integrated circuits General
Semiconductor devices. Integrated circuits General
Released: 2002-08-30
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BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Released: 2007-11-30
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