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369.60 EUR
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BS EN IEC 61967-8:2023 - TC
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Released: 2023-06-26
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BS IEC 61523-1:2023
Delay and power calculation standards Integrated Circuit (IC) Open Library Architecture (OLA)
Delay and power calculation standards Integrated Circuit (IC) Open Library Architecture (OLA)
Released: 2024-02-12
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24/30501110 DC
BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method
BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method
Released: 2024-09-27
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BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Released: 1994-05-15
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BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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BS IEC 60748-4-3:2006
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Released: 2007-02-28
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Released: 2014-09-30
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