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IEEE 1149.1-1990 - IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard Test Access Port and Boundary-Scan Architecture
Released: 21.05.1990
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156.10 EUR
IEEE 1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Released: 13.05.2013
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393.66 EUR
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415.04 EUR
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292.57 EUR
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309.10 EUR
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350.89 EUR
IEEE 1532-2000 - IEEE Standard for In-System Configuration of Programmable Devices
IEEE Standard for In-System Configuration of Programmable Devices
IEEE Standard for In-System Configuration of Programmable Devices
Released: 12.01.2000
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136.86 EUR
IEEE 1149.4-2024 - IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
Released: 06.12.2024
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116.64 EUR
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144.83 EUR
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130.44 EUR
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106.92 EUR
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97.20 EUR
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130.44 EUR
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156.10 EUR
IEEE 1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
Released: 20.03.2000
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140.07 EUR
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64.15 EUR
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79.70 EUR
IEEE 1149.1-2001 - IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
Released: 23.07.2001
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163.59 EUR
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286.55 EUR
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285.77 EUR
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359.25 EUR