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31.200 Integrated circuits. Microelectronics
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324.80 EUR
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176.96 EUR
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BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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246.40 EUR
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Released: 2014-09-30
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BS CECC 63101:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Released: 1985-01-15
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BS QC 760000:1990
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
Released: 1990-04-30
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BS IEC 60748-4-3:2006
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Released: 2007-02-28
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BS IEC 60748-1:2002
Semiconductor devices. Integrated circuits General
Semiconductor devices. Integrated circuits General
Released: 2002-08-30
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BS EN IEC 61967-4:2021
Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
Released: 2021-05-06
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