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DD IEC/TS 62215-2:2007
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
Released: 2007-11-30
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BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Released: 1994-05-15
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176.96 EUR
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BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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288.96 EUR
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BS IEC 63011-2:2018
Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
Released: 2019-01-24
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BS EN IEC 61967-4:2021
Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
Released: 2021-05-06
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324.80 EUR
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BS EN 190109:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU
Released: 1986-11-15
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246.40 EUR
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246.40 EUR
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176.96 EUR
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176.96 EUR
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324.80 EUR
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324.80 EUR
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176.96 EUR
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176.96 EUR
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176.96 EUR
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