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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-20
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606.21 USD
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23/30481371 DC
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
Released: 2023-10-20
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26.82 USD
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24/30488515 DC
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
Released: 2024-03-05
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BS IEC 63150-2:2025
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human arm swing motion
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human arm swing motion
Released: 2025-11-04
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311.15 USD
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24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
Released: 2024-08-01
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24/30488096 DC
BS EN IEC 62031 LED modules. Safety requirements
BS EN IEC 62031 LED modules. Safety requirements
Released: 2024-04-12
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24/30499668 DC
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
Released: 2024-08-30
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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Released: 2006-01-23
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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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466.73 USD
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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Released: 2003-01-17
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364.80 USD
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364.80 USD
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190.45 USD
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190.45 USD
BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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222.64 USD
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222.64 USD