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BS EN 62258-1:2010
Semiconductor die products Procurement and use
Semiconductor die products Procurement and use
Released: 2010-11-30
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410.40 USD
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BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Released: 2014-10-31
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431.86 USD
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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Released: 2010-11-30
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311.15 USD
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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311.15 USD
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BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Smart sensors. Control scheme of smart sensors
Released: 2019-11-29
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311.15 USD
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222.64 USD
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222.64 USD
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26.82 USD
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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311.15 USD
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BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 2020-07-22
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211.91 USD
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BS IEC 62830-7:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Released: 2023-07-07
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364.80 USD
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BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Released: 2024-02-29
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BS IEC 63601:2026
Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion
Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion
Released: 2026-02-10
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410.40 USD
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