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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Released: 2006-11-30
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192.12 USD
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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Released: 2006-01-23
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313.88 USD
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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Released: 2003-01-17
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368.00 USD
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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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470.82 USD
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470.82 USD
BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 2014-10-31
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192.12 USD
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224.59 USD
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BS IEC 60747-5-11:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
Released: 2020-01-14
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BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Released: 2021-09-14
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192.12 USD
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368.00 USD
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PD IEC TS 60747-19-2:2021
Semiconductor devices Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
Semiconductor devices Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
Released: 2021-07-02
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BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Released: 2021-07-07
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