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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Released: 2024-08-16
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27.06 USD
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27.06 USD
26/30544420 DC
BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices
BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices
Released: 2026-02-20
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27.06 USD
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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
Evaluation and routine testing in medical imaging departments Acceptance tests
Released: 1999-08-15
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435.65 USD
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435.65 USD
BS EN 60730-1:1995
Automatic electrical controls for household and similar use General requirements
Automatic electrical controls for household and similar use General requirements
Released: 2004-04-05
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470.82 USD
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470.82 USD
BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Released: 2013-04-30
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368.00 USD
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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Released: 2011-08-31
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368.00 USD
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368.00 USD
BS EN IEC 62969-1:2018
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Released: 2018-02-22
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224.59 USD
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224.59 USD
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224.59 USD
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224.59 USD
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224.59 USD
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224.59 USD
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313.88 USD
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313.88 USD
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313.88 USD
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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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