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25/30509883 DC
Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock
Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock
Released: 2025-02-06
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BS EN IEC 60947-10:2026
Low-voltage switchgear and controlgear Semiconductor circuit-breakers
Low-voltage switchgear and controlgear Semiconductor circuit-breakers
Released: 2026-07-07
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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
Evaluation and routine testing in medical imaging departments Acceptance tests
Released: 1999-08-15
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Released: 2014-10-31
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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
Semiconductor devices Microwave integrated circuits. Oscillators
Released: 2020-09-24
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BS EN IEC 60904-4:2020
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Released: 2020-10-19
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PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Released: 2021-11-19
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BS IEC 62047-41:2021
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Released: 2021-06-28
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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