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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
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23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Released: 2023-09-25
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BS EN IEC 60747-17:2020
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2021-02-03
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424.28 USD
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218.73 USD
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218.73 USD
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BS IEC 62047-53:2025
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Released: 2025-10-08
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BS IEC 63150-3:2025
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Released: 2025-11-04
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BS IEC 62047-47:2024
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Released: 2024-08-28
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Released: 2024-08-16
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26/30544420 DC
BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices
BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices
Released: 2026-02-20
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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
Evaluation and routine testing in medical imaging departments Acceptance tests
Released: 1999-08-15
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BS EN IEC 62969-1:2018
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
Released: 2018-02-22
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