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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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BS EN IEC 60904-4:2020
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Released: 2020-10-19
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358.40 USD
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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Released: 2011-08-31
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BS EN 60730-1:1995
Automatic electrical controls for household and similar use General requirements
Automatic electrical controls for household and similar use General requirements
Released: 2004-04-05
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Released: 2013-04-30
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BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Released: 2026-03-10
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PD IEC TR 63571:2025
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Released: 2025-05-16
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305.69 USD
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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Released: 2024-09-13
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26.35 USD
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