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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
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222.64 USD
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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Released: 2014-10-31
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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Released: 2011-08-31
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364.80 USD
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311.15 USD
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BS IEC 62047-41:2021
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Released: 2021-06-28
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PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Released: 2021-11-19
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466.73 USD
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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364.80 USD
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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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PD IEC TR 63571:2025
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Released: 2025-05-16
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BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Released: 2026-03-10
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26.82 USD
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26.82 USD