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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Released: 2015-07-31
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222.64 USD
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PD CLC/TR 62258-3:2007
Semiconductor die products Recommendations for good practice in handling, packing and storage
Semiconductor die products Recommendations for good practice in handling, packing and storage
Released: 2008-05-31
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410.40 USD
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BS EN 60464-2:2001
Varnishes used for electrical insulation Methods of test
Varnishes used for electrical insulation Methods of test
Released: 2007-02-28
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311.15 USD
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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
Released: 2000-08-15
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410.40 USD
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BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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466.73 USD
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BS EN 60747-16-3:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Frequency converters
Semiconductor devices Microwave integrated circuits. Frequency converters
Released: 2018-02-23
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431.86 USD
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311.15 USD
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BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
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364.80 USD
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BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications
LED modules for general lighting. Safety specifications
Released: 2022-03-31
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BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Released: 2020-07-22
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211.91 USD
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BS IEC 62830-1:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting
Released: 2020-07-21
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BS EN IEC 60747-17:2020
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2021-02-03
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