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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Released: 2024-09-13
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27.06 USD
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PD IEC TR 63571:2025
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Released: 2025-05-16
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313.88 USD
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313.88 USD
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27.06 USD
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BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Released: 2026-03-10
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224.59 USD
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26/30539985 DC
BS EN IEC 63608-2 Reliability evaluation methods for vibration energy harvesters Part 2: Temperature and humidity
BS EN IEC 63608-2 Reliability evaluation methods for vibration energy harvesters Part 2: Temperature and humidity
Released: 2026-06-12
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