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BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
Semiconductor devices Microwave integrated circuits. Amplifiers
Released: 2018-04-10
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389.76 EUR
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BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Smart sensors. Control scheme of smart sensors
Released: 2019-11-29
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259.84 EUR
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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BS EN 60512-2-6:2002
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Released: 2002-05-24
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159.04 EUR
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BS IEC 62047-32:2019
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
Released: 2019-01-29
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185.92 EUR
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BS IEC 60747-14-3:2009
Semiconductor devices Semiconductor sensors. Pressure sensors
Semiconductor devices Semiconductor sensors. Pressure sensors
Released: 2009-07-31
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259.84 EUR
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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Released: 2019-05-10
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259.84 EUR
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259.84 EUR
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185.92 EUR
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BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Released: 2015-07-31
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304.64 EUR
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BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Released: 2017-04-30
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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Released: 2003-01-20
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342.72 EUR
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342.72 EUR