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189.60 EUR
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189.60 EUR
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189.60 EUR
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189.60 EUR
BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices Microwave integrated circuits. Limiters
Released: 2023-05-25
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309.60 EUR
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309.60 EUR
BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Attenuators
Released: 2023-05-25
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348.00 EUR
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348.00 EUR
BS EN IEC 60747-16-9:2024
Semiconductor devices Microwave integrated circuits. Phase shifters
Semiconductor devices Microwave integrated circuits. Phase shifters
Released: 2024-11-20
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309.60 EUR
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BS EN IEC 60747-15:2024
Semiconductor devices Discrete devices. Isolated power semiconductor devices
Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-03
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367.20 EUR
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367.20 EUR
BS IEC 62047-48:2024
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
Released: 2024-06-11
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BS IEC 60747-5-14:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method
Released: 2024-09-26
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264.00 EUR
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264.00 EUR
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24.00 EUR
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24.00 EUR
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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264.00 EUR
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264.00 EUR
BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Released: 2018-03-16
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348.00 EUR
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348.00 EUR